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FEG-SEM Microscoape electronice Shottky de înalta rezolutie
MICROSCOP ELECTRONIC CU BALEIAJ Tip Quanta Inspect F, producator FEI- PHILIPS Olanda – ECOMET
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NIMP| Analiza microstructurala prin microscopie electronica de baleiaj (SEM) - NIMP
Scanning electron microscope (SEM) | Definition, Images, Uses, Advantages, & Facts | Britannica
Facultatea de Biologie - Laborator SEM
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